Leica DM3XL The Inspection System for Microelectronics and Semiconductor

Leica DM3XL The Inspection System for Microelectronics and Semiconductor

System for Microelectronics and Semiconductor. With a large field of view, the DM3 XL inspection system allows your team to identify defects faster and increase your yield rate. Make use of the 30% increased field of view of the unique macro objective. The DM3 XL uses LED illumination for all contrast methods. LED illumination provides a constant color temperature and offers real color imaging at all intensity levels.

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Description

System for Microelectronics and Semiconductor. With a large field of view, the DM3 XL inspection system allows your team to identify defects faster and increase your yield rate. Make use of the 30% increased field of view of the unique macro objective. The DM3 XL uses LED illumination for all contrast methods. LED illumination provides a constant color temperature and offers real color imaging at all intensity levels.

– True-to-life color imaging at all intensity levels
– Adjustment-free
– No bulb exchange – no down-time
– Reproducible results
– Examine sides, edges or chippings with oblique illumination: illuminate your sample from different angles as an easy and effective way to visualize topographies.
– Detect micro scratches