Materials Science

  • The Leica DM2700 M flexible upright microscope system uses LED illumination for all contrast methods: brightfield (BF), darkfield (DF), differential interference contrast (DIC), qualitative polarization (POL), and fluorescence (FLUO) applications. It also offers built-in oblique illumination, which improves the visualization of surface topography and defects. Optionally, the Leica DM2700 M can also be equipped with a transmitted light axis. The Leica DM2700 M is equipped, e.g. with an N PLAN achromatic objective series with magnifications from 5x to 100x, a field of view of 22 mm, a flattened image field, and large working distances.
  • The Leica DM2700 M flexible upright microscope system uses LED illumination for all contrast methods: brightfield (BF), darkfield (DF), differential interference contrast (DIC), qualitative polarization (POL), and fluorescence (FLUO) applications. It also offers built-in oblique illumination, which improves the visualization of surface topography and defects. Optionally, the Leica DM2700 M can also be equipped with a transmitted light axis. The Leica DM2700 M is equipped, e.g. with an N PLAN achromatic objective series with magnifications from 5x to 100x, a field of view of 22 mm, a flattened image field, and large working distances.
  • The Leica DM2700 M flexible upright microscope system uses LED illumination for all contrast methods: brightfield (BF), darkfield (DF), differential interference contrast (DIC), qualitative polarization (POL), and fluorescence (FLUO) applications. It also offers built-in oblique illumination, which improves the visualization of surface topography and defects. Optionally, the Leica DM2700 M can also be equipped with a transmitted light axis. The Leica DM2700 M is equipped, e.g. with an N PLAN achromatic objective series with magnifications from 5x to 100x, a field of view of 22 mm, a flattened image field, and large working distances.
  • The Leica DM2700 M flexible upright microscope system uses LED illumination for all contrast methods: brightfield (BF), darkfield (DF), differential interference contrast (DIC), qualitative polarization (POL), and fluorescence (FLUO) applications. It also offers built-in oblique illumination, which improves the visualization of surface topography and defects. Optionally, the Leica DM2700 M can also be equipped with a transmitted light axis. The Leica DM2700 M is equipped, e.g. with an N PLAN achromatic objective series with magnifications from 5x to 100x, a field of view of 22 mm, a flattened image field, and large working distances.
  • Depending on your application, you can choose from three different systems for polarization microscope. The Leica polarization microscope series is designed for all polarizing examinations: petrography, mineralogy, structure characterization, asbestos analysis, coal analysis (vitrinite reflection), and examination of liquid crystals.
  • Designed to help you maximize efficiency, Leica DCM8 unites the advantages of High Definition confocal microscopy with interferometry into one versatile, dual-core system. Ultra-fast analysis is ensured thanks to one-click mode selection, sophisticated software and HD confocal scanning without moving parts.
  • System for Microelectronics and Semiconductor. With a large field of view, the DM3 XL inspection system allows your team to identify defects faster and increase your yield rate. Make use of the 30% increased field of view of the unique macro objective. The DM3 XL uses LED illumination for all contrast methods. LED illumination provides a constant color temperature and offers real color imaging at all intensity levels.