Leica DM8000M & DM12000 M RL High Throughput Inspection & Review System

Leica DM8000M & DM12000 M RL High Throughput Inspection & Review System

The Leica DM8000 M and Leica DM12000 M optical inspection systems provide an innovative yet cost-effective system solution for mastering present and future inspection challenges with confidence. Inspection, process control and defect analysis of wafers or LCDs and TFTs has to be fast, To detect macro defects, the Leica DM8000 M and DM12000 M have a micro/macro mode for rapid scanning of large components. The macro magnification captures an object field of approximately 40 mm.

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Description

The Leica DM8000 M and Leica DM12000 M optical inspection systems provide an innovative yet cost-effective system solution for mastering present and future inspection challenges with confidence. Inspection, process control and defect analysis of wafers or LCDs and TFTs has to be fast, To detect macro defects, the Leica DM8000 M and DM12000 M have a micro/macro mode for rapid scanning of large components