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The Leica EM TXP is a target preparation device for milling, sawing, grinding, and polishing samples prior to examination by SEM, TEM, and LM techniques. -
With Leica EM VCT500 you can transfer samples under cryogenic conditions or at room temperature as well as under vacuum or protected atmosphere. -
The Leica EM UC7 prepares excellent quality semi- and ultra-thin sections, as well as the perfectly smooth surfaces required for LM, TEM, SEM, and AFM examination. The precision mechanics, ergonomic design, and intuitive layout of the touchscreen control unit make the Leica EM UC7 ideal for the highest quality specimen preparation