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Unique ion beam milling device with two modified saddle field ion sources of variable ion energy for optimum results. It combines the preparation of TEM, SEM, and LM samples in a single benchtop unit. -
The Leica EM TP is an instrument used for fixation and dehydration of samples for further treatment. It can be used for resin processing for electron microscopy (EM) and light microscopy (LM). -
The Leica EM AC20 automatic contrasting system for ultrathin sections ensures minimum user contact with reagents and reduced reagent consumption.