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High pressure freezing is key for the study of intricate changes in fine structure or cellular dynamics. Cryo-immobilize your aqueous samples under high pressure with a unique freezing principle and uncover secrets of the cellular process. -
The EM GP2 plunge freezes fluid or extremely thin samples spread on an electron microscopy grid into liquid ethane after removing excess fluid by automatic blotting. -
Freeze Substitution and Low Temperature Embedding System The Leica EM AFS2 performs freeze substitution and progressive lowering of temperature (PLT) techniques and allows low temperature embedding and polymerization of resins. -
During Cryo preparation, tools such as forceps and sample holders often ice over and cannot be immediately used for the next sample run. De-icing and drying of the tools at room temperature is time consuming and can cause damage to sensitive components and may prevent their operation. -
Producing homogenous and conductive metal or carbon coatings for SEM and TEM analysis was never more convenient than with the Leica EM ACE200 coating system. -
The EM ACE600 is a versatile high vacuum film deposition system, designed to produce very thin, fine-grained, and conductive metal and carbon coatings for the highest resolution analysis -
The Leica EM ACE900 is a high-end sample preparation system for freeze fracturing, freeze etching and high resolution cryo coating. This instrument is easy and intuitive to use. -
The Leica EM TXP is a target preparation device for milling, sawing, grinding, and polishing samples prior to examination by SEM, TEM, and LM techniques. -
The Leica EM RAPID milling system for pharmaceutical research enables sample preparation for analysis of active ingredient distribution on solid-dose pharmaceuticals. -
The Leica EM TRIM2 is a high-speed milling system with integrated stereomicroscope and LED ring illuminator for trimming of biological and industrial samples prior to ultramicrotomy. -
The Triple Ion Beam Milling System, EM TIC 3X allows production of cross sections and planar surfaces for Scanning Electron Microscopy (SEM), Microstructure Analysis (EDS, WDS, Auger, EBSD) and AFM investigations. -
Unique ion beam milling device with two modified saddle field ion sources of variable ion energy for optimum results. It combines the preparation of TEM, SEM, and LM samples in a single benchtop unit.